SuperMAXIMUM: A Schwarzschild-based, spectromicroscope for ELETTRA

Abstract

X ray microscopy excels on high-brightness sources, such as the Advanced Light Source and ELETTRA, where there is a good match between the source and optics phase spaces. In these conditions, diffraction-limited operation becomes possible with large flux. We will discuss the development of a second-generation x ray scanning spectromicroscope; an evolution of the MAXIMUM project at the University of Wisconsin. The new tool is called SuperMAXIMUM and will be installed on ELETTRA in Trieste, Italy. © 1995 American Institute of Physics.