Structured illumination microscopy/microscope (SIM) is an optical technique that has the capability of enhancing the lateral and axial resolution of a fluorescence widefield microscope.
CITATION STYLE
Masters, B. R. (2020). Structured Illumination Microscopy. In Springer Series in Optical Sciences (Vol. 227, pp. 233–260). Springer. https://doi.org/10.1007/978-3-030-21691-7_13
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