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HR-STEM Imaging and EELS Characterizing of Nano-Scale Defects in Sputter Deposited Thin Films of Double-Perovskite Sr 2 FeMoO 6 (SFMO) and Sr 2 CrReO 6 (SCRO)

  • Williams R
  • Hauser A
  • Richiardo R
  • et al.
Microscopy and Microanalysis (2011) 17(S2) 1654-1655
DOI: 10.1017/s1431927611009147
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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Williams, R., Hauser, A., Richiardo, R., Dixit, M., Lucy, J., Woodward, P., … Fraser, H. (2011). HR-STEM Imaging and EELS Characterizing of Nano-Scale Defects in Sputter Deposited Thin Films of Double-Perovskite Sr 2 FeMoO 6 (SFMO) and Sr 2 CrReO 6 (SCRO). Microscopy and Microanalysis, 17(S2), 1654–1655. https://doi.org/10.1017/s1431927611009147

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