Precession electron diffraction and its advantages for structural fingerprinting in the transmission electron microscope

Abstract

The foundations of precession electron diffraction in a transmission electron microscope are outlined. A brief illustration of the fact that laboratory-based powder X-ray diffraction fingerprinting is not feasible for nano-crystals is given. A procedure for structural fingerprinting of nanocrystals on the basis of structural data that can be extracted from precession electron diffraction spot patterns is proposed. © Oldenbourg Wissenschaftsverlag, München.