A Robust and Healthy Against PVT Variations TRNG Based on Frequency Collapse

Abstract

True Random Number Generator (TRNG) is used in many applications, generally for generating random cryptography keys. In this way, the trust of the cryptography system depends on the quality of the random numbers generated. However, the entropy fluctuations produced by external perturbations generate some false positives in the random sequence. These false positives can generate a disastrous scenario, depending on the application. This work presents the results of different tests to demonstrate the robustness and health of the TRNG based on frequency collapse. The TRNG passed all entropy tests provided for NIST SP800-90B and AIS31. The entropy test denotes a 0.9789 minimum normalized entropy and 7.998 Shannon entropy. In addition, the TRNG passes the health tests provided for NIST SP800-90B. The health test shows a number of identical values I_{v}=0\% , I_{v-1} < 0.004\% and a maximum cutoff value MC_{v}=10 with LMC_{v}=13 in the repetition count and adaptive proportion tests, respectively. The implementation passed all the statistical tests provided for NIST SP800-22 and AIS20. Besides, the implementation passes the different tests with Process, Voltage, and Temperature (PVT) variations. The TRNG is implemented in a 0.18~\mu m General Purpose (GP) CMOS technology, occupying 25600~\mu m^{2} with four entropy sources. Finally, the implementation presents a 7.3 until 9.2-Mb/s of bit rate, 0.56 until 1.88-mW of power consumption, and 77.2 until 204.3-pJ/bit of energy per bit using an entropy source with 16 and 2 delay stages, respectively.