X-ray diffraction line broadening due to dislocations in non-cubic materials. II. The case of elastic anisotropy applied to hexagonal crystals

Abstract

The calculation of orientation factors determining the anisotropy of dislocation-induced broadening of X-ray diffraction lines in crystals is treated for elastically anisotropic materials in terms of a general formalism. The application of the procedure is demonstrated by representation of a computer program and numerical calculations of orientation factors for different slip systems in hexagonal polycrystals with randomly oriented grains. A comparison of the results with those obtained in the approximation of elastic isotropy shows that the anisotropy of the diffraction-line broadening is essentially caused by the geometrical part of the orientation factor. In most cases the elastic anisotropy of the crystal leads only to small corrections.