Nanoelectronic primary thermometry below 4 mK

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Abstract

Cooling nanoelectronic structures to millikelvin temperatures presents extreme challenges in maintaining thermal contact between the electrons in the device and an external cold bath. It is typically found that when nanoscale devices are cooled to ∼ 10mK the electrons are significantly overheated. Here we report the cooling of electrons in nanoelectronic Coulomb blockade thermometers below 4 mK. The low operating temperature is attributed to an optimized design that incorporates cooling fins with a high electron-phonon coupling and on-chip electronic filters, combined with low-noise electronic measurements. By immersing a Coulomb blockade thermometer in the 3He/4He refrigerant of a dilution refrigerator, we measure a lowest electron temperature of 3.7mK and a trend to a saturated electron temperature approaching 3 mK. This work demonstrates how nanoelectronic samples can be cooled further into the low-millikelvin range.

Figures

  • Figure 1 | Details of the CBT device structure. (a) Optical micrograph of the CBT with equivalent circuit diagram and schematic cross-section of the
  • Figure 2 | CBT behaviour between 80 and 7mK in two dilution refrigerators. (a) CBT conductance G versus measured bias voltage VDC at four temperatures. Symbols show measured values and lines show best fits to the calculated ideal conductance. The warmest measurements (crosses, circles and squares) are fitted simultaneously to calibrate the sensor, giving CS¼ 236.6 fF and RT¼ 22.42 kO. The coldest measurement (triangles) is fitted using this calibration. The minimum electron temperatures Tmine are in close agreement with the refrigerator temperature measured by a RuO2 thermometer: 59.9, 40.1, 20.0 and 7.2mK respectively. The uncertainties on Tmine are calculated from uncertainties in the fitted parameters. (b) CBTelectron temperature Te versus refrigerator temperature Tmxc. Symbols show T min e from fits to conductance dips measured in the cryogen-free refrigerator (circles) and the custom refrigerator (triangles). Error bars are within the symbols. The solid curve shows Te determined by monitoring the conductance G0 (at VDC¼0) as the cryo-free fridge cools over 35min from 52 to 9mK, showing that the CBT has a stronger thermal link to the refrigerator than the RuO2 thermometer, leading to the thermal lag (TmxcZTe) during this time. The dashed line shows Te¼ Tmxc.
  • Figure 3 | Thermalization of two CBTs at a refrigerator temperature r2.8mK. (a) Cooling of one CBT in vacuum (circles) and one immersed in the 3He/4He refrigerant of the dilution refrigerator (triangles). In both cases, the CBTs are cooling after being warmed above 10mK by temporarily increasing the refrigerant temperature. The CBT in vacuum is extremely slow to thermalize. By comparison, the CBT immersed in 3He/4He thermalizes significantly faster. (b) Cooling of the immersed CBTafter it has been heated by a large DC drive current (50, 40 and 30 nA for run 1, 2 and 3, respectively). Fitting to an exponential decay (solid line) yields a time constant of 570 s and a saturation temperature of 3.8mK. (c) Schematic of the immersion cell used to cool a CBT in the 3He/4He mixture of a dilution refrigerator.
  • Figure 4 | Characteristics of a CBT immersed in 3He/4He refrigerant. (a) Fitting to the warmest three measurements gives CS¼ 209.5 fF and RT¼ 23.21 kO. The fitted minimum electron temperatures Tmine for the warmest three curves are in reasonable agreement with the refrigerator temperatures as measured by the vibrating wire resonator (VWR) thermometer: 29.4, 19.0 and 10.5mK, respectively. (b) Measured electron temperature in the CBTas the refrigerator cooled steadily from 10 to 2.7mK over a period of 12 h. The solid curve shows a fit of the form Txe ¼ Txmxc þ c, yielding an exponent x¼ 2.7. The dot-dashed curve shows a best fit of T5e ¼ T5mxc þ c. The dashed line shows Te¼ Tmxc. (c) The measured Te as the refrigerator was temporarily cooled in single-shot mode to 2.2mK, reaching a lowest Te below 3.7mK.

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Bradley, D. I., George, R. E., Gunnarsson, D., Haley, R. P., Heikkinen, H., Pashkin, Y. A., … Sarsby, M. (2016). Nanoelectronic primary thermometry below 4 mK. Nature Communications, 7. https://doi.org/10.1038/ncomms10455

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