CITATION STYLE
Bals, S., Batenburg, K. J., & Van Tendeloo, G. (2008). Discrete tomography in materials science: less is more? In EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (pp. 291–292). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_146
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