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Photoemission Electron Microscope

  • Kinoshita T
Springer Singapore, (2018), 465-469
DOI: 10.1007/978-981-10-6156-1_76
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Abstract

PEEM is one of the imaging type photoelectron microscopy (Kinoshita et al. in J Phys Soc Jpn 82 2013 [1]). The apparatus is equipped with some electrostatic lens systems, a microchannel plate (MCP) and a fluorescent screen. When excitation photons are injected onto a...

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Kinoshita, T. (2018). Photoemission Electron Microscope. In Compendium of Surface and Interface Analysis (pp. 465–469). Springer Singapore. https://doi.org/10.1007/978-981-10-6156-1_76

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