Crystallographic orientation assessment by electron backscattered diffraction

Abstract

With an angular orientation accuracy of at least 1°, the ability of electron backscattered diffraction (EBSD) to determine and emphasize crystallographic orientation is illustrated. Using the abilities of specially developed software for computing Euler angles derived from the scanned specimen, misorientations are pointed out with acceptable flexibility and graphic output through crystallographic orientation maps or pole figures. This ability is displayed in the particular case of laser cladding of nickel-based superalloy, a process that combines the advantages of a near net-shape manufacturing and a close control of the solidification microstructure (E-LMF: epitaxial laser metal forming).