Path-based integration testing of a software product line

Abstract

The testing of a product line is a more complex because variabilities spread across development processes and can be undetermined or absent while testing. Many existing studies of testing are focused on system testing, whereas integration testing is relatively rare. Because integration testing in SPLT tends to involve both domain testing and application testing, integration testing of SPL is necessary to clarify coverage problems in both testing stages. This is important in terms of thoroughness of testing but is also necessary to avoid redundant testing between two testing stages. In this paper, we propose the XX-MM-path-based integration testing method, which extends the MM-path-based testing method, and show how test coverage can be handled at both testing levels of domain and application testing. As a result, the MM-path-based integration testing method can be applied to the integration of common parts during domain testing without stub or driver implementation.