Microstructural Characterization Associated with Solid-Solid Transformations

Abstract

Materials scientists have long been interested in the characterization of complex poly-crystalline systems, as embodied in the distribution of grain size and shape, and have sought to link microstructural features with observed mechanical, electronic and magnetic properties [1]. The importance of detailed microstructural characterization is underscored by systems of limited spatial dimensionality, with length scales of the order of nanometers to microns, as their reliability and performance are greatly influenced by specific microstructural features rather than by average, bulk properties [2]. For example, the functionalities of many electronic devices depend critically on the microstructure of thin metallic films via the film deposition process and the occurrence of reactive phase formation at metallic contacts.