CITATION STYLE
Nishimoto, T., Abe, H., Fujiyama, Y., Kanai, M., Akechi, M., & Nakanishi, H. (2001). Evaluation of Silanol Concentration on Quartz Glass Surface for EOF Stability of CE Chip. In Micro Total Analysis Systems 2001 (pp. 595–596). Springer Netherlands. https://doi.org/10.1007/978-94-010-1015-3_260
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