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Characterisation of the Shape of Microparticles via Fractal and Fourier Analyses of Scanning Electron Microscope Images

  • Kindratenko V
  • Espen P
  • Treiger B
  • et al.
Springer Vienna, (1996), 355-361
DOI: 10.1007/978-3-7091-6555-3_28
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Abstract

Two different approaches based on Fourier and fractal analyses, are applied for particle shape characterisation. The advantages and limitations of both approaches as well as their fields of application are discussed. Examples of the application of these approaches for particles of various types are given.

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Kindratenko, V. V., Espen, P. J. M., Treiger, B. A., & Grieken, R. E. (1996). Characterisation of the Shape of Microparticles via Fractal and Fourier Analyses of Scanning Electron Microscope Images. In Microbeam and Nanobeam Analysis (pp. 355–361). Springer Vienna. https://doi.org/10.1007/978-3-7091-6555-3_28

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