Sub-Ångstrøm Low-Voltage Electron Microscopy — future reality for deciphering the structure of beam-sensitive nanoobjects?

Kaiser, U., Chuvilin, A., Schröder, R. R., Haider, M., & Rose, H. (2009). Sub-Ångstrøm Low-Voltage Electron Microscopy — future reality for deciphering the structure of beam-sensitive nanoobjects? In EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (pp. 35–36). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_18