Sub-Ångstrøm Low-Voltage Electron Microscopy — future reality for deciphering the structure of beam-sensitive nanoobjects?

  • Kaiser U
  • Chuvilin A
  • Schröder R
  • et al.
N/ACitations
Citations of this article
3Readers
Mendeley users who have this article in their library.
Get full text

Cite

CITATION STYLE

APA

Kaiser, U., Chuvilin, A., Schröder, R. R., Haider, M., & Rose, H. (2009). Sub-Ångstrøm Low-Voltage Electron Microscopy — future reality for deciphering the structure of beam-sensitive nanoobjects? In EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (pp. 35–36). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_18

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free