Abstract
Femtosecond pump-probe microscopy is used to directly visualize the diffusion of photogenerated charge carriers in undoped silicon nanowires, as well as charge separation in a nanowire encoded with an axial p-type/intrinsic/n-type (p-i-n) junction.
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CITATION STYLE
APA
Gabriel, M. M., Grumstrup, E. M., Kirschbrown, J. R., Pinion, C. W., Christesen, J. D., Zigler, D. F., … Papanikolas, J. M. (2015). Visualization of charge carrier motion in semiconductor nanowires with ultrafast pump-probe microscopy. In Springer Proceedings in Physics (Vol. 162, pp. 671–674). Springer Science and Business Media, LLC. https://doi.org/10.1007/978-3-319-13242-6_165
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