CITATION STYLE
Muto, S., Tatsumi, K., & Takahashi, H. (2009). Wavelength dispersive soft X-ray emission spectroscopy attached to TEM using multi-capirary X-ray lens. In EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (pp. 61–62). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_31
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