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Photoemission study of Eu valency in EuF3 ultrathin buried layers and single crystals

Physica Status Solidi (B) Basic Research (2004) 241(4)
DOI: 10.1002/pssb.200409032
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Abstract

X-ray Photoelectron Spectroscopy was used to investigate Eu valence in the following EuF3 samples: single crystal, buried MBE layers (Au/EuF3/GaAs and Au/EuF3/Fe/Ag/GaAs) and amorphous thin films. Evidence was found for a surface divalent Eu state present on single crystal and amorphous films, while the MBE ultra thin buried layers only exhibited a trivalent Eu state. © 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

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APA

Burian, W., Szade, J., O’Keevan, T., & Celiński, Z. (2004). Photoemission study of Eu valency in EuF3 ultrathin buried layers and single crystals. Physica Status Solidi (B) Basic Research, 241(4). https://doi.org/10.1002/pssb.200409032

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