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Book Chapter

Robust Design in the Case of Data Contamination and Model Departure

  • Ouyang L
  • Park C
  • Byun J
  • et al.
DOI: 10.1007/978-3-030-20709-0_15
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Ouyang, L., Park, C., Byun, J.-H., & Leeds, M. (2019). Robust Design in the Case of Data Contamination and Model Departure (pp. 347–373). https://doi.org/10.1007/978-3-030-20709-0_15

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