Coverage directed generation of system-level test cases for the validation of a DSP system

Abstract

We propose a complete methodology for the automatic generation of test cases in the context of digital circuit validation. Our approach is based on a software model of the system to verify in which some modules are written in the Esterel language. An initial test suite is simulated and the state coverage is computed. New test sequences are automatically generated to reach the missing states. We then convert those sequences into system-level test cases (i.e. instruction sequences) by a technique called "pipeline inversion". The method has been applied for the functional validation of an industrial DSP system giving promising results. © Springer-Verlag Berlin Heidelberg 2001.