Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Cite
CITATION STYLE
APA
Michael, J., Joy, D., & Griffin, B. (2010). Use of Sample Bias Voltage for Low-Energy High-Resolution Imaging in the SEM. Microscopy and Microanalysis, 16(S2), 614–615. https://doi.org/10.1017/s1431927610055315
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