Electron microscopy study of chemically deposited Ni-P films

Abstract

The structure of electroless thin films of Ni-P has been studied. The microstructure and the selected area diffraction pattern of the samples reveal that certain samples transform to crystalline Ni with P in solid solution by nucleation and growth, whereas others transform to crystalline state by growth alone. The former set of thin films having a P-content of 19-21 at.% is characterized as amorphous. Films with a P-content of 13-15 at.% fall in the latter category and are characterized as microcrystalline. Those with a P-content of 16-18 at.% contain both amorphous and microcrystalline regions. © 1986 the Indian Academy of Sciences.