Collaborative distributed computing in the field of digital electronics testing

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Abstract

Computation tasks used in digital design flow for test quality evaluation can require a lot of processor and memory resources. To speed up execution and to overcome memory restrictions, a collaborative computing approach was proposed in this paper. Web-based system architecture allows seamlessly aggregate many remote computers for one application. Efficient collaboration requires credit based priority concept, issues of task partitioning, task allocation, load balancing and model security must be handled. Experimental results show feasibility of proposed solution and gain in performance. © IFIP International Federation for Information Processing 2010.

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APA

Ivask, E., Devadze, S., & Ubar, R. (2010). Collaborative distributed computing in the field of digital electronics testing. In IFIP Advances in Information and Communication Technology (Vol. 322 AICT, pp. 145–152). https://doi.org/10.1007/978-3-642-14341-0_17

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