Size-dependant optical properties of nanoparticles analyzed by spectroscopic ellipsometry

Abstract

Spectroscopic ellipsometry, is a very power full tool for accurately investigating the optical properties of nanostructured materials in thin film form. In this chapter, the effect of dimensions on the properties of various nanoparticles including metal oxides, sulphides etc., have been discussed and reviewed. Basic principles of optical characterization using spectroscopic ellipsometry are presented. Results of ellipsometric studies of nanoparticles in thin film form for the determinations of various optical constants like band gap, absorption coefficient, extinction coefficient, refractive indices etc., and their variation with wavelength are presented. Strengths and weaknesses of the ellipsometric techniques compared with other optical techniques are also discussed.