A Si/CdTe Compton Camera for gamma-ray lens experiment

Abstract

Cadmium telluride (CdTe) and cadmium zinc telluride (CdZnTe) have been regarded as promising semiconductor materials for hard X-ray and γ-ray detection. However, a considerable amount of charge loss in these detectors results in a reduced energy resolution. We have achieved a significant improvement in the spectral properties by forming the Schottky junction on the Te side of the CdTe wafer. With the further reduction of leakage current by an adoption of guard ring structure, we have demonstrated a CdTe pixel detector with high energy resolution and full charge collection capabilty. The detector has a pixel size of a few mm and a thickness of 0.5-1 mm. We apply this high resolution detector to a new silicon and CdTe Compton Camera which features high angular resolution. We also describe a concept of the stack detector which consists of many thin CdTe layers and provides sufficient efficiency for hard X-rays and gamma-rays up to several hundred keV maintaining good energy resolution. A narrow-FOV Compton telescope can be realized by installing a Si/CdTe Compton Camera inside the deep well of an active shield. This configuration is very suitable as focal plane detector for future focusing gamma-ray missions. © 2006 Springer.