CITATION STYLE
Ranjan, A., Raghavan, N., Shubhakar, K., O’Shea, S. J., & Pey, K. L. (2020). Random telegraph noise nano-spectroscopy in high-? dielectrics using scanning probe microscopy techniques. In Noise in Nanoscale Semiconductor Devices (pp. 417–440). Springer International Publishing. https://doi.org/10.1007/978-3-030-37500-3_12
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