Abstract
SEM images are subject to defects that can arise from a variety of mechanisms, including charging, radiation damage, contamination, and moiré fringe effects, among others. Image defects are very dependent on the specific nature of the specimen, and often they are anecdotal, experienced by not reported in the SEM literature. The examples described below are not a complete catalog but are presented to alert the microscopist to the possibility of such image defects so as to avoid interpreting artifact as fact.
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CITATION STYLE
Goldstein, J. I., Newbury, D. E., Michael, J. R., Ritchie, N. W. M., Scott, J. H. J., & Joy, D. C. (2018). Image Defects. In Scanning Electron Microscopy and X-Ray Microanalysis (pp. 133–146). Springer New York. https://doi.org/10.1007/978-1-4939-6676-9_9
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