Measurement and characterization of exposure systems for high-frequency, ultrashort pulses

Abstract

This chapter summarizes the experimental dosimetry techniques developed for exposures to high-intensity, ultrashort pulses in the nanosecond domain. The dosimetry or characterization of the exposure conditions was performed by experimental and numerical techniques. Typical frequency and time domain techniques for characterization of exposure systems are described in this chapter. In the frequency domain, classical microwave devices for low voltage are used such as the vector network analyzer. Specific components and setups required for time domain characterization of high-intensity electric field (>MV/m), highvoltage (>kV), nanosecond duration pulses are presented. A new technique for measuring temperature at the cellular and intracellular levels is also presented to complete these macroscopic measurements at the level of the exposure system. Numerical dosimetry that can serve to complete or to access quantities difficult to measure was also briefly introduced.