Transfer of monolayer TMD WS 2 and Raman study of substrate effects

Abstract

A facile transfer process for transition metal dichalcogenide WS 2 flakes is reported and the effect of the underlying substrate on the flake properties is investigated using Raman spectroscopy. The flakes are transferred from their growth substrate using polymethyl methacrylate (PMMA) and a wet etch to allow the user to transfer the flakes to a final substrate using a microscope and micromanipulator combined with semi-Transparent Kapton tape. The substrates used range from insulators such as industry standard high-k dielectric HfO 2 and "green polymer" parylene-C, to conducting chemical vapor deposition (CVD) grown graphene. Raman spectroscopy is used first to confirm the material quality of the transferred flakes to the substrates and subsequently to analyze and separate the effects arising from material transfer from those arising from interactions with the substrate. We observe changes in the Raman spectra associated with the interactions between the substrates in the flakes. These interactions affect both in-plane and out-of-plane modes in different ways depending on their sources, for example strain or surface charge. These changes vary with final substrate, with the strongest effects being observed for WS 2 transferred onto graphene and HfO 2, demonstrating the importance of understanding substrate interaction for fabrication of future devices.