Effect of microstructure on electrical properties of cu2znsns4 films deposited from inks

Abstract

Electrical properties of Cu2ZnSnS4 (CZTS), potential absorber materials for low-cost solar cells, are significantly affected by its microstructure. In this paper, effect of microstructure on electrical properties of CZTS films have been studied from 77 to 300 K. Temperature variation of electrical conductivity of structurally different films revealed that transport of holes is by either hopping in defect states or activated band conduction depending on the temperature range. The electrical conductivity and activation energy changes significantly with the structure of the films.