Morphological features of nanostructured sensor for X-Ray and optical imaging, based on nonideal heterojunction

Abstract

A novel nanostructured sensor for X-ray and optical images obtaining is developed on the basis of nonideal heterojunction CdS-Cu2S. Microscopy studies have been conducted to determine the optimum method of sensor manufacturing. The analysis of the original data set with microscopic image comparison of polycrystalline films on different technological parameters showed that the most homogeneous surface structure presents on samples, which CdS layer is obtained by vacuum thermal evaporation of CdS layer. This finding is consistent with results of current-voltage characteristics analysis, which showed the presence of high quality CdS-Cu2S heterostructure, obtained by mentioned base layer forming methodics.