CITATION STYLE
Abu-Rahma, M. H., & Anis, M. (2013). Characterization of SRAM Sense Amplifier Input Offset for Yield Prediction. In Nanometer Variation-Tolerant SRAM (pp. 155–167). Springer New York. https://doi.org/10.1007/978-1-4614-1749-1_6
Mendeley helps you to discover research relevant for your work.