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Book Chapter

Reliability of memories and microprocessors

  • Băjenescu T
  • Bâzu M
Springer Berlin Heidelberg, (1999), 277-312
DOI: 10.1007/978-3-642-58505-0_9
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Băjenescu, T. I., & Bâzu, M. I. (1999). Reliability of memories and microprocessors. In Reliability of Electronic Components (pp. 277–312). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-642-58505-0_9

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