Adaptive simulated annealing for standard cell placement

Abstract

A standard cell placement algorithm based on adaptive simulated annealing is presented in this paper. Considering the characters of different circuits to be placed, adaptively initial temperature and adaptive searching region are added to traditional simulated annealing algorithm. At the same time, the punishment item in objective function and initial placement approach are improved for the standard cell placement problem. This algorithm is applied to test a set of benchmark circuits, and experiments reveal its advantages in placement results and time performance when compared with the traditional simulated annealing algorithm. © Springer-Verlag Berlin Heidelberg 2005.