Application of magnetic force microscopy in nanomaterials characterization

Abstract

This review describes the basic technical aspects of magnetic force microscopy and how this technique has been applied to the study of colossal magnetoresistance materials, superconductors, and patterned magnetic materials. Recently, current distribution in a patterned aluminum strip has been measured by magnetic force microscopy, opening the possibility of measuring currents in buried interconnects in integrated circuits. © 2006 Wiley-Liss, Inc.