With the advent of VLSI circuits, exhaustive functional testing has become unfeasible and has led to the appearance of structural tests aimed at detecting possible faulty conditions [16]. Such conditions have to be modeled by fault models. A fault model is a...
CITATION STYLE
Traditional SRAM Fault Models and Test Practices. (2008) (pp. 79–101). https://doi.org/10.1007/978-1-4020-8363-1_4
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