High power laser diodes are fabricated using two different etchants by wet etching method. Sidewall roughness of the stripe in two cases is extracted using AFM and scattering loss due to this roughness is calculated theoretically by using well established model and exponential autocorrelation function for the roughness.
CITATION STYLE
Jain, D., Mahajan, S., Jain, A., Singh, M., & Mohammed, S. (2019). Estimation of scattering loss due to sidewall roughness in high power laser diodes. In Springer Proceedings in Physics (Vol. 215, pp. 963–966). Springer Science and Business Media, LLC. https://doi.org/10.1007/978-3-319-97604-4_146
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