Temperature measurement of single-walled carbon nanotubes by Raman scattering

  • CHIASHI S
  • MURAKAMI Y
  • MIYAUCHI Y
  • et al.
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Abstract

Raman scatterings from various SWNT samples were measured at a wide range of temperatures (from 4 K to about 1000 K). With increase in sample temperature, both the Raman shift and the intensity of G-band of SWNTs decreased, while the peak width increased. Through the comprehensive calibration, the temperature of SWNTs can be measured by using the temperature dependence of Raman shift and the intensity in the G-band. The temperature distribution of SWNTs induced by the Raman excitation laser was measured with this temperature measurement technique of SWNTs.

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CHIASHI, S., MURAKAMI, Y., MIYAUCHI, Y., & MARUYAMA, S. (2004). Temperature measurement of single-walled carbon nanotubes by Raman scattering. The Proceedings of the Thermal Engineering Conference, 2004(0), 143–144. https://doi.org/10.1299/jsmeted.2004.143

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