The achievement of nanometer spatial resolution with direct elemental selectivity would have a tremendous impact on our ability to probe and understand complex phenomena occurring at the nanoscale. The combination of synchrotron-based X-ray spectroscopy with the high spatial resolution of scanning tunneling microscopy (STM) has the potential to help attain this goal. In this chapter we show how synchrotron X-ray-enhanced scanning tunneling microscopy (SXSTM) has evolved from the very early days of photo-assisted STM to become a promising spectroscopy and imaging technique in nanoscience and nanotechnology. The basic principles of SXSTM are discussed accompanied by a presentation of recent experiments.
CITATION STYLE
Rose, V., Freeland, J. W., & Streiffer, S. K. (2010). New Capabilities at the Interface of X-Rays and Scanning Tunneling Microscopy. In Scanning Probe Microscopy of Functional Materials (pp. 405–431). Springer New York. https://doi.org/10.1007/978-1-4419-7167-8_14
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