High‐Resolution Imaging of Texture and Microstructure by the Moving Detector Method

Abstract

In order to describe texture and microstructure of a polycrystalline material completely, crystal orientation g = { ϕ 1 Φ ϕ 2 } must be known in all points x = { x 1 x 2 x 3 } of the material. This can be achieved by locationresolved diffraction of high‐energy, i.e. short‐wave, X‐rays from synchrotron sources. Highest resolution in the orientation‐ as well as the location‐coordinates can be achieved by three variants of a detector “sweeping” technique in which an area detector is continuously moved during exposure. This technique results in two‐dimensionally continuous images which are sections and projections of the six‐dimensional “orientation– location” space. Further evaluation of these images depends on whether individual grains are resolved in them or not. Because of the high penetration depth of high‐energy synchrotron radiation in matter, this technique is also, and particularly, suitable for the investigation of the interior of big samples.