Near-field high-frequency probing

Abstract

We review a range of near-field probes that have been used for measuring the localized high-frequency electromagnetic properties of materials. First, near-field microscopy is briefly discussed, thereby establishing a background for describing near-field probing experiments. The basic dielectric properties of metals, insulators, and dielectrics are briefly reviewed since these provide the basis for image contrast. Finally, a wide range of near-field probes are described, including optical, infrared, microwave, etc. The literature on high-frequency near-field probes is surveyed throughout the text. © 2007 Springer Science+Business Media, LLC.