Scanning probe microscopy in mineralogical studies: About origin of the observed roughness of natural silica-rich glasses

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Abstract

We have studied different mineralogical objects: natural glasses of impact (tektites, impactites) and volcanic (obsidians) origin, using atomic force microscopy, X-ray microanalysis, infrared and Raman spectroscopy. The spectroscopy showed the difference in the structure and chemical composition of the glasses of different origin. The analysis of the dependence of nanoscale heterogeneity of the glasses, revealed by the atomic force microscopy, on their structural and chemical features was carried out.

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Golubev, Y. A., & Isaenko, S. I. (2017). Scanning probe microscopy in mineralogical studies: About origin of the observed roughness of natural silica-rich glasses. In IOP Conference Series: Materials Science and Engineering (Vol. 256). Institute of Physics Publishing. https://doi.org/10.1088/1757-899X/256/1/012019

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