Abstract
The SNS H - ion source is a dual-frequency RF-driven (13.56-MHz low power continuous RF superimposed by 2-MHz high power pulsed RF with ∼1.0 ms pulse length at 60 Hz), Cs-enhanced ion source. This paper discusses the applications of optical emission spectroscopy for the ion source plasma conditioning, cesiation, failure diagnostics, and studies of plasma build-up and outage issues.
Cite
CITATION STYLE
Han, B. X., Stockli, M. P., Welton, R. F., Murray, S. N., Pennisi, T. R., & Santana, M. (2015). Application of optical emission spectroscopy for the SNS H - ion source plasma studies. In AIP Conference Proceedings (Vol. 1655). American Institute of Physics Inc. https://doi.org/10.1063/1.4916430
Register to see more suggestions
Mendeley helps you to discover research relevant for your work.
