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Secondary Electrons

  • Goldstein J
  • Newbury D
  • Michael J
  • et al.
Springer New York, (2018), 29-37
DOI: 10.1007/978-1-4939-6676-9_3
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Abstract

Secondary electrons (SE) are created when inelastic scattering of the beam electrons ejects weakly bound valence electrons (in the case of ionically or covalently bonded materials) or conduction band electrons (in the case of metals), which have binding energies of ~...

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Goldstein, J. I., Newbury, D. E., Michael, J. R., Ritchie, N. W. M., Scott, J. H. J., & Joy, D. C. (2018). Secondary Electrons. In Scanning Electron Microscopy and X-Ray Microanalysis (pp. 29–37). Springer New York. https://doi.org/10.1007/978-1-4939-6676-9_3

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