Reversing the Resistivity Contrast in the Phase-Change Memory Material GeSb2Te4 Using High Pressure

Abstract

Phase-change memory devices distinguish “1” and “0” states by the electrical contrast between the amorphous and the crystalline phases. Under ambient conditions, the amorphous phase normally exhibits a higher resistivity, exceeding its crystalline counterpart by 2–5 orders of magnitude. Here, however, it is demonstrated that such pronounced resistivity contrast is remarkably reduced and even reversed with increasing hydrostatic-like pressure in the prototypical phase-change material GeSb2Te4 (GST). This anomalous resistivity reversal originates from the differences in the pressure-induced atomic rearrangement of these two phases, as revealed by ab initio molecular dynamics simulations. Specifically, a low to medium pressure (<7 GPa) primarily compresses the bonds in crystalline GST without significantly displacing the atoms and vacancies off the lattice sites. As a result, only relatively small changes in the band structure are induced. In contrast, in amorphous GST, the fraction of voids changes drastically with pressure and the Peierls-like distortion is greatly reduced, yet the average bond length remains almost constant. These effects eventually turn the semiconducting glass into a metallic one. Our work reveals distinct behaviors of amorphous and crystalline phase-change materials under stress, shedding light on the mechanisms of electronic transport in different phases, and thus may have important implications on the design of phase-change memory devices.