The Impact of Trap-Assisted Tunneling and Poole–Frenkel Emission on Synaptic Potentiation in an α-Fe2O3/p-Si Memristive Device

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Abstract

A signature of synaptic potentiation conductance has been observed in an α-Fe2O3/p-Si device fabricated using spin coating. The conductance of the device in dark conditions and illumination with a white light source was characterized as a function of the application of a periodic bias (voltage) with a triangular profile. The conductance of the device increases with the number of voltage cycles applied and plateaus to its maximum value of 0.70 μS under dark conditions and 12.00 μS under illumination, and this mimics the analog synaptic weight change with the action potential of a neuron. In the range of applied voltage from 0 V to 0.7 V, the conduction mechanism corresponds to trap-assisted tunneling (TAT) and in the range of 0.7–5 V it corresponds to the Poole–Frenkel emission (PFE). The conductance as a function of electrical pulses was fitted with a Hill function, which is a measure of cooperation in biological systems. In this case, it allows one to determine the turn-on threshold (K) of the device in terms of the number of voltage pulses, which are found to be 3 and 166 under dark and illumination conditions, respectively. The gradual conductance change and activation after a certain number of pulses perfectly mimics the synaptic potentiation of neurons. In addition, the threshold parameter extracted from the Hill equation fit, acting as the number of pulses for synaptic activation, is found to have programmability with the intensity of the light illumination.

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Mainali, P., Wagle, P., McPherson, C., & McIlroy, D. N. (2023). The Impact of Trap-Assisted Tunneling and Poole–Frenkel Emission on Synaptic Potentiation in an α-Fe2O3/p-Si Memristive Device. Sci, 5(1). https://doi.org/10.3390/sci5010003

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