Abstract
The application of focused ion beam techniques to a range of topics in materials science is reviewed. Recent examples in the literature are cited along with illustrations of numerous applications. Potential artifacts that can arise are discussed along with commentary on minimizing their impact. © 2005 Springer Science+Business Media, Inc.
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APA
Phaneuf, M. W. (2005). FIB for materials science applications - A review. In Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice (pp. 143–172). Springer US. https://doi.org/10.1007/0-387-23313-X_8
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