Classification of the Destruction Effects in CMOS-Devices after Impact of Fast Transient Electromagnetic Pulses

Abstract

In this paper will be presented how an electronic system and its components will respond in case of an impact of an external electromagnetic pulse (EMP). In the first instance the coupling process of transient electromagnetic pulses into electronic systems will be shown. Out of that the disturbing signal inside the system, which is necessary for the following simulation, will be described analytically. Furthermore, the microscopical analysis of the occuring destruction effects will be shown. The theory of the multiphysics simulation, which connects the heat transfer and electrostatics modules, will be discussed in detail. Against this background, simulations of different destruction effects will be shown in comparison to the microscopical analysis. The gain in new information about the destruction processes will be discussed.