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Testing Defects and Parametric Variations in RAMs

  • Sachdev M
  • Gyvez J
Springer US, (2007), 151-223
DOI: 10.1007/0-387-46547-2_5
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Sachdev, M., & Gyvez, J. P. de. (2007). Testing Defects and Parametric Variations in RAMs. In Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (pp. 151–223). Springer US. https://doi.org/10.1007/0-387-46547-2_5

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