Optimum Tests Selection for Analog Circuits with the Use of Genetic Algorithm

Abstract

This paper deals with the problem of optimum test pro gram development in analog circuit testing process. Pre-production testing and production testing are taken into account by the presented algorithm. Genetic algorithms are used as a new method for optimum test selection. This approach enhances quality and speeds up finding suboptimal solutions by finding more then one good result in each genetic algorithm cycle. Results for a hypothetical example are given to clarify and discuss the method and they seem to be very promising..